Chipavg {BSDA}R Documentation

Measurements of the thickness of the oxide layer of manufactured integrated circuits

Description

Data for Exercises 6.49 and 7.47

Usage

Chipavg

Format

A data frame with 30 observations on the following 3 variables.

wafer1
a numeric vector
wafer2
a numeric vector
thickness
a numeric vector

Source

Kitchens, L. J. (2003) Basic Statistics and Data Analysis. Duxbury

Examples

str(Chipavg)
attach(Chipavg)
EDA(thickness)
t.test(thickness,mu=1000)
boxplot(wafer1,wafer2,name=c("Wafer 1","Wafer 2"))
shapiro.test(wafer1)
shapiro.test(wafer2)
t.test(wafer1,wafer2,var.equal=TRUE)
detach(Chipavg)

[Package BSDA version 0.1 Index]