GD {PASWR} | R Documentation |
Contains time until failure in hours for a particular electronic component subjected to an accelerated stress test.
GD
A data frame with 100 observations on the following variable:
attf
Ugarte, M. D., Militino, A. F., and Arnholt, A. T. (2008) Probability and Statistics with R. Chapman & Hall/CRC.
attach(GD) hist(attf,prob=TRUE) lines(density(attf)) detach(GD)