indiumoxide {diffractometry}R Documentation

Diffractogram of Indium oxide doped with tin

Description

Example of a diffractogram used in Davies et al. (2008)

Usage

data(indiumoxide)

Details

The diffractogram was taken on a thin film of In_2 O_3 :Sn, i.e. indium oxide doped with tin. This material is usually called ITO (indium-tin-oxide). It has a good electrical conductivity and is transparent in the visible wave length region. The first column of the matrix contains the angles of diffraction, the second column contains the corresponding photon counts.

Author(s)

D. Mergel

References

P.L. Davies, U. Gather, M. Meise, D. Mergel, T. Mildenberger (2008): "Residual based localization and quantification of peaks in x-ray diffractograms", to appear in the Annals of Applied Statistics. http://arxiv.org/abs/0711.3687


[Package diffractometry version 0.1-00 Index]